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			Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai. by International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi Sakai, Akira Series: Materials science forum ; v. 725. Material type: Text; Format: available online ; Literary form: Not fiction Publication details: Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, ©2012 Online resources: Click here to access online Availability: Items available for loan: OPJGU Sonepat- Campus (1). Place hold Add to cart (remove)
			Gettering and defect engineering in semiconductor technology XV : selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference, September 22-27, 2013, Oxford, UK / edited by J.D. Murphy. by Gettering and Defect Engineering in Semiconductor Technology Conference (15th : 2013 : Oxford, Great Britain) Murphy, J. D [editor.] Series: Diffusion and defect data. Pt. B, Solid state phenomena ; ; v. 205/206. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Durnten-Zurich : Trans Tech publications Ltd, [2014] Other title: Gettering and defect engineering in semiconductor technology 15 Online resources: Click here to access online Availability: Items available for loan: OPJGU Sonepat- Campus (1). Place hold Add to cart (remove)

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