Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman.

Includes bibliographical references and index.

Online resource; title from e-book title screen (World Scientific platform, viewed January 17, 2017).

"As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures."--Provided by publisher.

Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells -- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross -- Aberration Corrected Electron Microscopy / Philip E. Batson -- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp -- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo -- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others] -- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan.

Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver -- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman -- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others] -- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang -- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight -- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable.

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