Secondary analysis of sample surveys principles, procedures and potentialities
Material type: TextPublication details: New York John Wiley 1972Description: xiii,347p. 24 cmISBN:- 0471426059
- 300.723 22 HY-S
- HN29 .H88
Item type | Home library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
OPJGU Sonepat- Campus FOB Library | General Books | 300.723 HY-S (Browse shelf(Opens below)) | Not For Loan | 002826 |
Browsing OPJGU Sonepat- Campus shelves, Collection: General Books Close shelf browser (Hides shelf browser)
No cover image available | No cover image available | |||||||
300.723 FO-S Standardized survey interviewing minimizing interviewer-related error | 300.723 GI-O Observation techniques structured to unstructured | 300.723 HE-P Practical sampling | 300.723 HY-S Secondary analysis of sample surveys principles, procedures and potentialities | 300.723 HY-S Survey design and analysis principles, cases and procedures | 300.723 KI-S Survey sampling | 300.723 LI-F Focus group methodology principles and practices |
Includes bibliographical references.
There are no comments on this title.
Log in to your account to post a comment.