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- International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) (Meeting Name)
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Work cat.: (JGU)2738706: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan), Defects-recognition imaging and physics in semiconductors XIV :, ©2012.